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AIBIZ Secures Its 16th Patent for 'Wafer Map AI Pattern Classification'
Source : Money Today (https://news.mt.co.kr)
Registered : 2024-11-14
AIBIZ2024Views 20
AIBIZ (CEO Ha Seung-jae), a manufacturing process diagnostics AI (artificial intelligence) solutions company, announced on the 14th that it has obtained a patent for a 'model training method, device, and program for classifying wafer map patterns.' According to the company, this is its 16th patent related to AI processes and the like.
This patent is a technology that uses AI to learn and automatically classify defect patterns of wafer maps in semiconductor manufacturing processes. The AI model has a retraining function that continuously adapts to new defect patterns, so its performance improves each time process data is updated. AIBIZ said the technology focuses on improving the stability and productivity of manufacturing processes.
AIBIZ also holds patents for various process diagnostics technologies, such as 'anomaly detection using multiple video data' and 'detection of abnormal operation of process equipment.' Through these, it analyzes time-series process data in real time to detect anomalies and reduce operators' subjective errors. In particular, it is applying AI-based automated diagnostics solutions to the manufacturing industry, raising productivity and the efficiency of quality control.
AIBIZ CEO Ha Seung-jae said, "By advancing process diagnostics AI technology, we will improve the quality of manufacturing processes and maximize industrial efficiency," and "Through the digital transformation of manufacturing and AI technology innovation, we will strengthen our competitiveness in the global market."
